IEEE review of on-state voltage measurement circuits

IEEE has published a review paper on on-state voltage measurement circuits for power semiconductor devices, focusing on device-level and converter-level topologies.

• The paper surveys resistor-based, diode-based, and transistor-based OVMCs, compares their advantages, limitations, settling time, error, bandwidth, and proposes a new four-criterion classification.
• It also discusses applications in EV fast-charging infrastructure, large-scale data centers, dynamic RDS(ON) measurement for GaN devices, and suitability for bidirectional GaN transistors.